Cart
0
Product
Products
(empty)
No products
To be determined
Shipping
$0.00
Total
Product successfully added to your shopping cart
Quantity
Total
There are 0 items in your cart.
There is 1 item in your cart.
Total products
Total shipping
To be determined
Total
Sale!
View larger
View larger
JIS K 0131:1996 (R2016)
New product
JIS K 0131:1996 (R2016)
General rules for X-ray diffractometric analysisMore info
This Japanese Industrial Standard specifies the general rules for the measurements of diffracted X-ray using a X-ray diffractometer in order to make the identification and determination, the accurate measurement of lattice constant, and the measurement of crystallinity degree, of substances.
| Author | JSA |
|---|---|
| Editor | JSA |
| Document type | Standard |
| Format | File |
| Confirmation date | 2016-10-20 |
| ICS | 71.040.50 : Physicochemical methods of analysis
|
| Number of pages | 60 |
| Year | 1990 |
| Document history | |
| Country | Japan |
| Keyword | JIS 0131;0131;JIS K 0131-1996 |