Cart
0
Product
Products
(empty)
No products
To be determined
Shipping
$0.00
Total
Product successfully added to your shopping cart
Quantity
Total
There are 0 items in your cart.
There is 1 item in your cart.
Total products
Total shipping
To be determined
Total
Sale!
View larger
View larger
DIN 50450-3:1991-03
New product
DIN 50450-3:1991-03
Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of methane impurity in H2, O2, N2, Ar and He by using a flame ionization detector (FID)More info
The standard should define the test method for determining the content of NH4 in the carrier and doping gases H2, O2, N2, Ar and He by using a FID.
| Author | DIN |
|---|---|
| Editor | DIN |
| Document type | Standard |
| Format | File |
| Cancellation date | |
| Confirmation date | |
| expiration_de_validite | |
| ICS | 29.045 : Semiconducting materials
71.100.20 : Gases for industrial application |
| Number of pages | 2 |
| Replace | DIN 50450-3 (1989-12) |
| Year | 1990 |
| Document history | DIN 50450-3 (1991-03) |
| Country | Germany |
| Keyword | DIN 50450;50450 |