Cart
0
Product
Products
(empty)
No products
To be determined
Shipping
$0.00
Total
Product successfully added to your shopping cart
Quantity
Total
There are 0 items in your cart.
There is 1 item in your cart.
Total products
Total shipping
To be determined
Total
Sale!
View larger
View larger
DIN 50450-2:1991-03
New product
DIN 50450-2:1991-03
Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of oxygen impurity in N2, Ar, He, Ne and H2 by using a galvanic cellMore info
The standard should define the test method for determining the content of O2 in the carrier and doping gases N2, Ar, He, Ne and H2.
| Author | DIN |
|---|---|
| Editor | DIN |
| Document type | Standard |
| Format | File |
| Cancellation date | |
| Confirmation date | |
| expiration_de_validite | |
| ICS | 29.045 : Semiconducting materials
71.100.20 : Gases for industrial application |
| Number of pages | 2 |
| Replace | DIN 50450-2 (1989-12) |
| Year | 1990 |
| Document history | DIN 50450-2 (1991-03) |
| Country | Germany |
| Keyword | DIN 50450;50450 |