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DIN 32877:2000-08
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DIN 32877:2000-08
Optoelectronic measurement of distance, profile and formMore info
The document deals optoelectronic linear measurent methods. It covers concepts and principles of measurements, defines requirements and testing of characteristics quantities.
| Author | DIN |
|---|---|
| Editor | DIN |
| Document type | Standard |
| Format | File |
| ICS | 17.040.30 : Measuring instruments
|
| Number of pages | 12 |
| Replace | DIN 32877 (1992-02) |
| Set | DIN-TAB 11-2000 |
| Year | 2000 |
| Document history | DIN 32877 (2000-08) |
| Country | Germany |
| Keyword | 32877 |