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DIN 50451-1:2003-04

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DIN 50451-1:2003-04

Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 1: Silver (Ag), gold (Au), calcium (Ca), copper (Cu), iron (Fe), potassium (K) and sodium (Na) in nitric acid by AAS

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The document specifies a method for testing nitric acid for the relevant metal traces of silver, gold, copper, iron, potassium and sodium in trace quantities, for which the method of atomic absorption spectroscopy (AAS) with electrothermic atomizing is used. The range of application covers trace element mass fractions from 0,1 ng/g to 50 ng/g.

Author DIN
Editor DIN
Document type Standard
Format File
Cancellation date
Confirmation date
expiration_de_validite
ICS 29.045 : Semiconducting materials
Number of pages 8
Replace DIN 50451-1 (1987-10)
Year 2003
Document history DIN 50451-1 (2003-04)
Country Germany
Keyword DIN 50451;50451