JIS R 1633:1998 (R2017)

This Japanese Industrial Standard specifies the sample preparation method of bulk fine ceramics and fine ceramic powders for scanning electron microscope (SEM) observation using the SEM which is capable f observing the sample not in the dry condition, the volatile sample, and the non-conductive sample, is not provided with any special function nor structure, and is capable of being using under the pressure in the sample chamber of 10*2 Pa or under.