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The purpose of this technical report is to provide users the necessary information on the electrical testing of device embedded substrates, in specific interconnection open/short test as well as device functional test.
| Author | DIN |
|---|---|
| Editor | DIN |
| Document type | Standard |
| Format | File |
| expiration_de_validite | 2014-05-28 |
| ICS | 31.180 : Printed circuits and boards
|
| Number of pages | 21 |
| Replace | DIN EN 62326-15 (2012-01) |
| Cross references | IEC 91/1138A/CD (2013-11), IDT |
| Year | 2014 |
| Document history | DIN IEC/TR 62878-2-2 (2014-04) |
| Country | Germany |
| Keyword | DIN IEC/TR 62878;DIN IEC/TR 62878-2;62878 |