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DIN SPEC 52407:2015-03
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DIN SPEC 52407:2015-03
Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)More info
This DIN SPEC describes different methods for preparation, measurement and interpretation which allow for reliable determinations of the particle size of close distributed reference nanoparticles in suspensions and aerosols with AFM and TSEM.
| Author | DIN |
|---|---|
| Editor | DIN |
| Document type | Standard |
| Format | File |
| ICS | 07.120 : Nanotechnologies
|
| Number of pages | 23 |
| Year | 2015 |
| Document history | |
| Country | Germany |
| Keyword | 52407 |