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DIN IEC/TS 62607-6-4 DIN SPEC 42607-6-4:2016-01
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DIN IEC/TS 62607-6-4 DIN SPEC 42607-6-4:2016-01
Nanomanufacturing - Key control characteristics - Part 6-4: Graphene - Conductance measurements using resonant cavity (IEC 113/269/CD:2015)More info
This part of IEC 62607 establishes a method for determining the surface conductance of 2D single-layer or multi-layer atomically thin nano-carbon graphene structures. These are synthesized by chemical vapour deposition (CVD), epitaxial growth on silicon carbide (SiC), obtained from reduced graphene oxide (rGO) or mechanically exfoliated from graphite. The measurements are made in an air filled standard R100 (WR-90) rectangular waveguide configuration in the X-band, at one of the resonant frequency modes, typically at 7 GHz.
| Author | DIN |
|---|---|
| Editor | DIN |
| Document type | Standard |
| Format | File |
| expiration_de_validite | 2016-02-04 |
| ICS | 07.120 : Nanotechnologies
|
| Number of pages | 33 |
| Cross references | IEC 113/269/CD (2015-06), IDT |
| Year | 2016 |
| Document history | |
| Country | Germany |
| Keyword | DIN IEC/TS 62607;DIN IEC/TS 62607-6;62607 |