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DIN 51179:2016-08

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DIN 51179:2016-08

Vitreous and porcelain enamels - Low-voltage test for detecting and locating defects on profiled surfaces - Slurry test

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This document specifies a low-voltage test method used to detect and identify the location of defects (pores, cracks or spalling) going to the substrate of enamel coatings on corrugated and/or beaded profiles.

Author DIN
Editor DIN
Document type Standard
Format File
ICS 25.220.50 : Enamels
Number of pages 8
Replace DIN 51179 (2014-09)
Year 2016
Document history DIN 51179 (2016-08)
Country Germany
Keyword 51179