No products
View larger
New product
This document specifies a low-voltage test method used to detect and identify the location of defects (pores, cracks or spalling) going to the substrate of enamel coatings on corrugated and/or beaded profiles.
| Author | DIN |
|---|---|
| Editor | DIN |
| Document type | Standard |
| Format | File |
| ICS | 25.220.50 : Enamels
|
| Number of pages | 8 |
| Replace | DIN 51179 (2014-09) |
| Year | 2016 |
| Document history | DIN 51179 (2016-08) |
| Country | Germany |
| Keyword | 51179 |