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This standard specifies, how to to determine the mass of metallic layers on metallic or non-metallic substrates by means of spectrometric measurement methods after the layer has been dissolved.
| Author | DIN |
|---|---|
| Editor | DIN |
| Document type | Standard |
| Format | File |
| ICS | 17.040.20 : Properties of surfaces
|
| Number of pages | 14 |
| Replace | DIN 50988-2 (1988-04) |
| Year | 2018 |
| Document history | DIN 50990 (2018-12) |
| Country | Germany |
| Keyword | 50990 |