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The standard describes significant influences on the precision of measurements using radiation thermometers and explains their effects on a typical application. The procedure for choosing a suitable wavelength range for contact-free temperature measurements is described. The emissivity of important materials are summed up in a table. The influence of the object temperature, the dimension of the measurement field, and the setting time on the temperature resolution reachable are discussed.
| Author | VDI |
|---|---|
| Editor | VDI |
| Document type | Standard |
| Format | File |
| ICS | 17.200.20 : Temperature-measuring instruments
|
| Number of pages | 38 |
| Replace | VDI/VDE 3511 Blatt 4.5 (2014-04) |
| Year | 2015 |
| Document history | VDI/VDE 3511 Blatt 4.5 (2015-06) |
| Country | Germany |
| Keyword | VDI 3511;VDI 3511 Blatt 4.5;VDI/VDE 3511;3511 |