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This standard describes the use of transmission Fresnel zone plates as lenses for X-rays. The physical principles are explained briefly. The typical parameters of Fresnel zone plates which are important for X-ray optics are elaborated on. The determination of these parameters by measurements is described in detail. The main applications are X-ray microscopy and X-ray spectral microscopy. This standard addresses users, developers and manufacturers of X-ray microscopes using transmission zone plates for imaging and focussing.
| Author | VDI |
|---|---|
| Editor | VDI |
| Document type | Standard |
| Format | File |
| ICS | 17.180.30 : Optical measuring instruments
|
| Number of pages | 11 |
| Replace | VDI/VDE 5575 Blatt 5 (2011-08) |
| Year | 2018 |
| Document history | VDI/VDE 5575 Blatt 5 (2018-09) |
| Country | Germany |
| Keyword | VDI 5575;VDI 5575 Blatt 5;VDI/VDE 5575;5575 |