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JIS K 0143:2000 (R2014)
New product
JIS K 0143:2000 (R2014)
Surface chemical analysis - Secondary ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materialsMore info
| Author | JSA |
|---|---|
| Editor | JSA |
| Document type | Standard |
| Format | File |
| Confirmation date | 2014-10-20 |
| ICS | 71.040.40 : Chemical analysis
|
| Number of pages | 21 |
| Replace | JIS K 0143 (2000-03) |
| Cross references | ISO 14237 (2000-02), IDT |
| Year | 2000 |
| Document history | JIS K 0143 (2000-07-20) |
| Country | Japan |
| Keyword | JIS 0143;0143 |