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JIS K 0146:2002 (R2016)
New product
JIS K 0146:2002 (R2016)
Surface chemical analysis - Sputter depth profiling - Optimization using layered systems as reference materialsMore info
| Author | JSA |
|---|---|
| Editor | JSA |
| Document type | Standard |
| Format | File |
| Confirmation date | 2016-10-20 |
| ICS | 71.040.40 : Chemical analysis
|
| Number of pages | 20 |
| Replace | JIS K 0146 (2001-11) |
| Cross references | ISO 14606 (2000-10), IDT |
| Year | 2002 |
| Document history | JIS K 0146 (2002-03-20) |
| Country | Japan |
| Keyword | JIS 0146;0146 |