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JIS K 0145:2002 (R2016)
New product
JIS K 0145:2002 (R2016)
Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scalesMore info
| Author | JSA |
|---|---|
| Editor | JSA |
| Document type | Standard |
| Format | File |
| Confirmation date | 2016-10-20 |
| ICS | 17.180.30 : Optical measuring instruments
71.040.50 : Physicochemical methods of analysis |
| Number of pages | 32 |
| Replace | JIS K 0145 (2001-11) |
| Cross references | ISO 15472 (2001-02), IDT |
| Year | 2002 |
| Document history | JIS K 0145 (2002-03-20) |
| Country | Japan |
| Keyword | JIS 0145;0145 |