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JIS R 1660-1:2004 (R2013)
New product
JIS R 1660-1:2004 (R2013)
Measurement method for dielectric properties of fine ceramics in millimeter wave frequency range - Part 1: Cutoff waveguide methodMore info
| Author | JSA |
|---|---|
| Editor | JSA |
| Document type | Standard |
| Format | File |
| Confirmation date | 2013-10-21 |
| ICS | 31.080.01 : Semiconductor devices in general
81.060.30 : Advanced ceramics |
| Number of pages | 28 |
| Year | 2004 |
| Document history | |
| Country | Japan |
| Keyword | JIS R 1660;JIS 1660;1660 |