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This part of JIS C 5381 specifies avalanche breakdown diodes which represent one type of surge protective device component used in the design and construction of surge protective devices connected to low-voltage power distribution systems, transmission, and signaling networks. Test specifications in this Standard are for single ABDs consisting of two terminals. However, multiple ABDs may be assembled within a single package defined as a diode array. Each diode within the array can be tested to this specification. This Standard contains a series of test criteria for determining the electrical characteristics of the ABD. From the standard test methods described herein, the performance characteristics and ratings of the ABD can be verified or established for specific packaged designs
| Author | JSA |
|---|---|
| Editor | JSA |
| Document type | Standard |
| Format | File |
| Confirmation date | 2014-10-20 |
| ICS | 29.120.50 : Fuses and other overcurrent protection devices
31.080.10 : Diodes |
| Number of pages | 16 |
| Cross references | IEC 61643-321 (2001-12), IDT
|
| Year | 2004 |
| Document history | |
| Country | Japan |
| Keyword | JIS C 5381;JIS 5381;5381 |