Cart
0
Product
Products
(empty)
No products
To be determined
Shipping
$0.00
Total
Product successfully added to your shopping cart
Quantity
Total
There are 0 items in your cart.
There is 1 item in your cart.
Total products
Total shipping
To be determined
Total
Sale!
View larger
View larger
JIS C 2170:2004 (R2013)
New product
JIS C 2170:2004 (R2013)
Electrostatics - Methods of test for determining the resistance and resistivity of solid planar materials used to avoid electrostatic charge accumulationMore info
This International Standard describes test methods for the determination of the electrical resistance and resistivity of solid materials in the range from 10 to the 4th to 12th power ohms used to avoid electrostatic charge accumulation. It takes account of existing IEC/ISO standards and other published information, and gives recommendations and guidelines on the appropriate method
| Author | JSA |
|---|---|
| Editor | JSA |
| Document type | Standard |
| Format | File |
| Confirmation date | 2013-10-21 |
| ICS | 17.220.20 : Measurement of electrical and magnetic quantities
|
| Number of pages | 15 |
| Cross references | IEC 61340-2-3 (2000-03), IDT |
| Modified by | JIS C 2170/ERRATUM 1 (2010-12-09) |
| Year | 2004 |
| Document history | |
| Country | Japan |
| Keyword | JIS 2170;2170 |