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JIS K 0149-1:2008 (R2017)
New product
JIS K 0149-1:2008 (R2017)
Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnificationMore info
| Author | JSA |
|---|---|
| Editor | JSA |
| Document type | Standard |
| Format | File |
| Confirmation date | 2017-10-20 |
| ICS | 37.020 : Optical equipment
|
| Number of pages | 20 |
| Cross references | ISO 16700 (2004-03), MOD |
| Year | 2008 |
| Document history | |
| Country | Japan |
| Keyword | JIS K 0149;JIS 0149;0149 |