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JIS K 0190:2010 (R2015)
New product
JIS K 0190:2010 (R2015)
Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometryMore info
| Author | JSA |
|---|---|
| Editor | JSA |
| Document type | Standard |
| Format | File |
| Confirmation date | 2015-10-20 |
| ICS | 71.040.50 : Physicochemical methods of analysis
|
| Number of pages | 12 |
| Cross references | ISO 17470 (2004-09), MOD |
| Year | 2010 |
| Document history | |
| Country | Japan |
| Keyword | JIS 0190;0190 |